Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution

Scanning transmission electron microscopy at high resolution.

We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 ...

First Demonstration of Phase Contrast Scanning Transmission Electron Microscopy

Biological molecules are composed of light elements and can be considered as phase objects for the electron waves. Therefore, images of their unstained specimens show low contrast in transmission electron microscopy (TEM). Phase contrast TEM (P-TEM) is one of the powerful techniques to enhance image contrast of the phase objects [1]. In P-TEM, the phase plate (PP) is placed at a back focal plan...

Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution

Using state of the art scanning transmission electron microscopy (STEM) it is nowadays possible to directly image single atomic columns at sub-Å resolution. In standard (high angle) annular dark field STEM ((HA)ADF-STEM), however, light elements are usually invisible when imaged together with heavier elements in one image. Here we demonstrate the capability of the recently introduced Integrated...

Z-contrast Scanning Transmission Electron Microscopy

Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron Microscopy Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron Microscopy

Dr. ir. A.J. den Dekker heeft als begeleider in belangrijke mate aan de totstandkoming van het proefschrift bijgedragen.